Packaging & Testing

MEMS & IC Solutions

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We provides plastic, leadless, die-form and ceramic packaging solutions tailored to your application’s electrical, thermal, and mechanical needs.

Packaging

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  • Die-form like WLCSP, COB (Chip-On-Board) enables compact, high-performance integration for wearables and portable devices
  • Plastic packages (SOIC, TSSOP, QFN, DIP) deliver cost-effective scalability for industrial and consumer electronics
  • Ceramic packages offer hermetic sealing and high reliability for space, imaging and aerospace-grade MEMS

Functional Testing

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100% wafer level test on automatic probe station. KGD mapping files and electro-mechanical tests data shall be delivered

Electrical parameters:

  • Rest capacitance
  • Capacitance variation
    Resistance values

Mechanical parameters:

  • Resonance frequency between 1kHz and 50kHz
  • Quality factor between 100 and 1M
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